Journal of Applied Physics | Vol.24, Issue.8 | | Pages 1037
Beta‐Ray Spectrometer Line Shapes with Tilted Sources
Abstract Experimental line shapes arising from tilted beta‐ray spectrometer sources are compared with analytically derived line shapes. Although the increased scattering in the source at higher tilting angles considerably alters the experimental line shape, the sharp leading edges predicted for the larger angles are largely retained. This is true for electron energies at least as low as 400 kev, even for quite dense sources (5 mg/cm2). An application of the increased resolution resulting from this feature is given.
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Beta‐Ray Spectrometer Line Shapes with Tilted Sources
Abstract Experimental line shapes arising from tilted beta‐ray spectrometer sources are compared with analytically derived line shapes. Although the increased scattering in the source at higher tilting angles considerably alters the experimental line shape, the sharp leading edges predicted for the larger angles are largely retained. This is true for electron energies at least as low as 400 kev, even for quite dense sources (5 mg/cm2). An application of the increased resolution resulting from this feature is given.
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