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Applied Optics | Vol.55, Issue.29 | | Pages 8368-8375

Determination of optical constants including surface characteristics of optically thick nanostructured Ti films: analyzed by spectroscopic ellipsometry

SamtaChauhan JyotiJaiswal RameshChandra GauravMalik ManpreetSingh SatyendraMourya RituDaipuriya AmitSanger

Abstract

In the present work, optically thick nanostructured titanium (Ti) films of thickness ranging from ∼100 to 900 nm were deposited on a glass substrate by DC magnetron sputtering at room temperature. Microstructural and surface properties of the samples were studied by x-ray diffraction and ... [Appl. Opt. 55, 8368-8375 (2016)]

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Determination of optical constants including surface characteristics of optically thick nanostructured Ti films: analyzed by spectroscopic ellipsometry

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appl opt 55 83688375 xray diffraction surface dc magnetron sputtering

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SamtaChauhan,JyotiJaiswal, RameshChandra, GauravMalik, ManpreetSingh, SatyendraMourya, RituDaipuriya, AmitSanger,.Determination of optical constants including surface characteristics of optically thick nanostructured Ti films: analyzed by spectroscopic ellipsometry. 55 (29),8368-8375.

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